News: General News

12th October 2023

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4D Technology event at Glyndwr University, 16 March 2023

4D Technology in conjunction with Quantum Design are hosting a workshop ‘Inteferometry for Metrology’ at the OpTIC Technology Centre, Glyndwr University, St Asaph on 16 March 2023.

23rd January 2023 • Read »

Alignment and Level in the Nuclear Industry

Taylor Hobson measurement products have been used for many years in the nuclear industry for checking, measuring and monitoring alignment and level. Camera systems and motorised focus accessories allow the telescope to be operated remotely from the telescope.

13th September 2022 • Read »

A fresh approach to dimensional metrology from the comfort of your desk

An easy way to view the full dimensional metrology range in one virtual showroom:

8th July 2021 • Read »

peen marking / engraving - micro features

Peen marking/engraving for parts identification is a critical element in industries such as aviation, defence and medical

7th September 2020 • Read »

Taylor Hobson Alignment Telescopes help shipbuilding industry meet their green credentials

Shipbuilders around the world are currently facing the challenge of reducing their environmental impact. The alignment telescope is used for accurate alignment of engines, propeller shafting and stern tubes - reducing vibration and wear which cause fuel inefficiencies.

23rd April 2020 • Read »

4D Technology event at Rolls-Royce Technology Hub, Derby University

Seminar: 3D micro-surface measurements of precision components, Wednesday 8th November 2023, 8.30am - 12.15pm.

Hosted at the new Rolls Royce Technology Hub Lab at the University of Derby, this seminar promises to be an informative discussion of different micro defect inspection techniques, chaired by Dr Erik Novak (PhD Optical Sciences) of 4D Technology Corp.  The event will discuss:

  • Shopfloor, micrometer-scale measurement,
  • Surface roughness characterization techniques,
  • Parameters and recent advances
  • Time for hands-on measurements

Learn more about the event and register to attend: