News: Press Release

6th March 2018

More News

A Metrology Open Day hosted by Spectrum Metrology, 26th June 2019

Explore New Dimensions at the National Space Centre: Spectrum Metrology will be hosting an Open Day this June in conjunction with Taylor Hobson and FARO. Register now ...

12th March 2019 • Read »

4D Inspec XL micro-defect measurement system wins 2019 Prism award

We are pleased to announce that the 4D InSpec XL surface defect gauge has won the 2019 Prism award in Test and Measurement. The award was presented to 4D Technology during the Photonics West 2019 expo by SPIE, the International Society for Optics and Photonics.

20th February 2019 • Read »

Autocollimator used to test innovative Scanner System to monitor pollution

Autocollimators were used to align the optical components when the University of Leicester built the pioneering CompAQS scanner in collaboration with Surrey Satellite Technology and DL Optics Ltd

18th October 2018 • Read »

Alignment Telescopes used by Cammell Laird on the RRS Sir David Attenborough

Shipbuilders and marine engineers Cammell Laird are using the Micro Alignment Telescope to assist with precise alignment of the ships propeller shafts to the marine engine during build of the Sir David Attenborough polar research vessel

26th January 2018 • Read »

New Automatic prism and polygon checker launched at Photonics West

Taylor Hobson will launch its automatic prism/polygon measurement system at the forthcoming Photonics West exhibition in San Francisco this month.

15th January 2018 • Read »

Digital Projectors and Video Measurement Microscopes in sharp focus at MACH

Although shadowgraphs have been available for many years they remain a popular choice for many parts with complex profiles, such as screw threads, gear teeth, nozzles, fuel injectors, and other precision components.  Developed to meet modern-day needs, the Schneider digital projector range combines proven projector technology with digital image processing and analysis, including import of DXF files for rapid comparison.

Digital projector with DXF import
Digital projector with DXF import

Traditional shadowgraphs allow the critical features of a workpiece to be projected in silhouette but the Schneider digital projector also uses an LED top light illumination system to view additional component features.  This combined with a high resolution digital camera gives a noticeably sharp, distortion free image, clearly displayed on an integrated touchscreen panel PC.  The built-in software has integrated overlays (eg cross hairs and concentric circles) and allows DXF files to be imported.  Once the DXF is positioned over the image of the workpiece, the software ‘locks’ the DXF file over the component for fast definition of circles,  lines, angles and more.

The digital projector incorporates a high precision measuring stage (with measuring range options up to 500x200mm) and various objective options for magnifications from 10x to 60x.

WM1 video measurement microscope with incident light
WM1 video measurement microscope with incident light

Where more rigorous measurements are required, the Schneider WM1 video measurement microscope takes camera based measurement one step further.  The WM1 combines a high resolution CCD camera with top light illumination and a precision measurement stage for the best possible clarity of image.  The system has precise edge detection in transmitted or incident light conditions thanks to intelligent image analysis algorithms.  Configured to meet individual requirements, the CNC model can also be extended into a multi-sensor device with the addition of a tactile probe.  A range of image field sizes are available or manual/motorised zoom can be selected.

The digital projector and workshop microscope are just 2 of the metrology systems in the Schneider range, which also includes shaft measurement systems, large volume profile projectors and rapid 2D measurement devices.  Spectrum Metrology will be on stand H18-341 in the Inspection Zone at the MACH exhibition (NEC, 9-13 April 2018) and will be pleased to discuss your measurement requirements.  Or contact us for further details.