News: Press Release

12th March 2019

More News

4D Inspec XL micro-defect measurement system wins 2019 Prism award

We are pleased to announce that the 4D InSpec XL surface defect gauge has won the 2019 Prism award in Test and Measurement. The award was presented to 4D Technology during the Photonics West 2019 expo by SPIE, the International Society for Optics and Photonics.

20th February 2019 • Read »

Autocollimator used to test innovative Scanner System to monitor pollution

Autocollimators were used to align the optical components when the University of Leicester built the pioneering CompAQS scanner in collaboration with Surrey Satellite Technology and DL Optics Ltd

18th October 2018 • Read »

Digital Projectors and Video Measurement Microscopes in sharp focus at MACH

Spectrum Metrology invites visitors to the MACH exhibition to witness the optical clarity and precision of their latest digital projectors and video microscopes, manufactured by German designers Dr Schneider Messtechnik.

6th March 2018 • Read »

Alignment Telescopes used by Cammell Laird on the RRS Sir David Attenborough

Shipbuilders and marine engineers Cammell Laird are using the Micro Alignment Telescope to assist with precise alignment of the ships propeller shafts to the marine engine during build of the Sir David Attenborough polar research vessel

26th January 2018 • Read »

New Automatic prism and polygon checker launched at Photonics West

Taylor Hobson will launch its automatic prism/polygon measurement system at the forthcoming Photonics West exhibition in San Francisco this month.

15th January 2018 • Read »

A Metrology Open Day hosted by Spectrum Metrology, 26th June 2019

Spectrum Metrology will be hosting a Metrology Open Day at the National Space Centre Leicester this June in conjunction with Taylor Hobson and FARO (Wednesday 26th June, 10am-4pm).

Spectrum Metrology is inviting interested parties to see a range of measurement instruments and discuss their metrology requirements in a relaxed atmosphere at this unique venue.  A number of metrology products and technologies will be available including:

The Surtronic S-Series portable roughness checker from Taylor Hobson.  This latest model in the well-known Surtronic  range makes use of the latest smartphone technology with ruggedised touch screen, long life batteries and USB connectivity.  The wide measurement range and large choice of surface roughness parameters make the Surtronic S100 robust enough for the shop floor and flexible enough for any inspection room.

WM1 Video Microscope for precision geometry measurements.  The WM1 combines a high resolution CCD camera with top light illumination and a precision measurement stage for the best possible clarity of image.  The system has precise edge detection in transmitted or incident light conditions thanks to intelligent image analysis algorithms.  Configured to meet individual requirements, the CNC model can also be extended into a multi-sensor device with the addition of a tactile probe.  A range of image field sizes are available or manual/motorised zoom can be selected.  Spectrum Metrology will be pleased to discuss your requirements or measure any sample components you may wish to bring to the show.

A full range of metrology equipment will be at the open day for measurement of roundness, form, surface finish and dimensions.  A range of FARO metrology systems will also be available with specialists available from Taylor Hobson, FARO and Spectrum to discuss any metrology issues.

Attendance of the Open Day includes free entry to the Space Centre which comprises six differently themed galleries (visit  

To register, please e-mail your details to